VALUE Engrafting - Tech Notes
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Tech Notes


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Tips for Testing Panelized Boards at ICT

This paper discusses guidelines which need to be considered when testing panelized boards. (1997)

Teradyne ICT Debug Procedure
This Applications Note provides a procedure for efficiently debugging test programs on the Z18XX and Spectrum testers. (2000)

Streamlining In-Circuit Test Development
This paper looks at 4 ways to increase the efficiency and effectiveness of your In-Circuit test development. (1997)

Balancing Development Costs and Yields
This paper describes ways to decrease test time and increase fault coverage, thereby improving the effectiveness of ICT. (1999)


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VALUE Engrafting
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