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Tips for Testing Panelized Boards at ICT
This paper discusses guidelines which need to be considered when testing panelized boards. (1997)
Teradyne ICT Debug Procedure
This Applications Note provides a procedure for efficiently debugging test programs on the Z18XX and Spectrum testers. (2000)
Streamlining In-Circuit Test Development
This paper looks at 4 ways to increase the efficiency and effectiveness of your In-Circuit test development. (1997)
Balancing Development Costs and Yields
This paper describes ways to decrease test time and increase fault coverage, thereby improving the effectiveness of ICT. (1999) |