In-Circuit Test Development

Thousands of Test Program Set ("TPS") developments for these platforms means maximized test coverage, optimize test times, and minimized false failures.

Fast turn-around times.

Full documentation packages delivered with each TPS.

Gauge R&R Studies (with CP and CPK)for every project.

Device programming for Flash PROMs, EEPROMs, PICs, et al.

Boundary-Scan Testing.

Philosophy of "No compromise" regarding Test Coverage. The best test possible based on the board’s design and the tester’s capabilities will be provided.

Test Coverage Reports customized and itemized device-by-device will be generated.

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